| 摘要 |
PROBLEM TO BE SOLVED: To obtain a magnetic shield layer thickness detector for detecting the existence and the film thickness of the magnetic shield layer when coating a magnetic shield coating liquid on the surface of a base film, utilizing the Hall effect of a semiconductor Hall element. SOLUTION: The magnetic shield layer thickness detector for detecting a magnetic shield layer formed by coating a magnetic shield material on the surface of a base film 19 detects the existence and the film thickness of the shield layer from a magnetic detection output of a magnetic detector element. The detector is composed of a magnet 2, the magnetic detector element 11 and an amplifier 16. The magnet 12 and the detector element 11 are held with a specified distance, the amplifier 16 is connected to the detector element 11 to amplify the detection output from the detector element 11, and the base film 19 having a shield layer formed thereon passes in a plane facing the magnet and the detector element, without contacting them.
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