| 摘要 |
PROBLEM TO BE SOLVED: To realize a sorting test of an image sensor with a simple circuit without using a special purpose circuit tester and to realize simultaneous measurements of a plurality of image sensors. SOLUTION: A measuring circuit of the image sensor 22 has a pixel array 1 in which a plurality of pixel cells 2 each for converting a light signal into an electric signal are arrayed. The measuring circuit comprises a sample-and- hold circuit 31 connected to a pixel output terminal 13 of the sensor 22 to sample data output o the cell 2 at arbitrary timing, comparators 34 and 35 each for comparing an output value of the circuit 31 with an upper limit specification value or a lower limit specification value, and latched circuits 36 and 37 for latching the output value when the output value of the circuit 31 exceeds the specified value. In this case, a pixel defect is easily measured by monitoring the outputs of the circuits 36 and 37. |
