| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory and its test method which can perform easily a test utilizing a high voltage. SOLUTION: This device is a semiconductor memory comprising first and second memory arrays 1, 3 having a normal operation mode and a test mode and sense amplifiers 13, 15 comprising bit lines BL1, BL2, transistors NT1-NT8 connected between the first and the second memory cell arrays 1.3 and the sense amplifiers 13, 15, a VDD pre-charge circuit 9 supplying VDD voltage to gates of the transistors NT1-NT8 in a normal mode, also the device is provided with a VPP pre-charge circuit 11 supplying VPP voltage being higher than VDD voltage to gates of the transistors NT1-NT8 in a test mode.
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