发明名称 |
METHOD FOR MEASURING THICKNESS OF MAGNETIC LAYER OF MAGNETIC RECORDING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring the thickness and its standard deviation of the magnetic layer of a high-density magnetic recording medium with high accuracy. SOLUTION: In the method for measuring the thickness of the magnetic layer of a magnetic recording medium having the magnetic layer and a nonmagnetic layer adjacent to each other, the characteristic X-ray derived from the element included in only one of the magnetic layer and the nonmagnetic layer is measured by the energy-dispersive X-ray spectroscopy on the cross section of the magnetic recording medium to obtain a characteristic X-ray image corresponding to the cross section, and then the thickness of the magnetic layer is determined from the obtained image.
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申请公布号 |
JP2002074650(A) |
申请公布日期 |
2002.03.15 |
申请号 |
JP20000264148 |
申请日期 |
2000.08.31 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
KANAZAWA MINORU;SUEKI MINORU |
分类号 |
G01B15/02;G11B5/84;(IPC1-7):G11B5/84 |
主分类号 |
G01B15/02 |
代理机构 |
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主权项 |
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地址 |
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