发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and its manufacturing method having a plurality of kinds of drain currents in the case that a plurality of non-volatile memory transistors exist and charge is injected into a floating gate. SOLUTION: The semiconductor device includes a plurality of the non-volatile memory transistors 100, 200. The non-volatile memory transistors 100, 200 have the floating gates 120, 220 arranged by interposing first insulation layers 112, 212 on a semiconductor board 10, second insulation layers 140, 240 coming into contact with at least a part of the floating gates 120, 220, control gates 150, 250 formed on the second insulation layers 140, 240, and source areas 114, 214 and drain areas 116, 216 formed in the semiconductor board 19. The volume of the floating gates 120, 220 have two kinds or more.
申请公布号 JP2002076146(A) 申请公布日期 2002.03.15
申请号 JP20000258608 申请日期 2000.08.29
申请人 SEIKO EPSON CORP 发明人 KUWAZAWA KAZUNOBU
分类号 H01L29/43;H01L21/8247;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L29/43
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