发明名称 Photoresist dispense arrangement by compensation for substrate reflectivity
摘要 In the manufacture of a semiconductor device, an arrangement for forming a layer on a semiconductor substrate compensates for variations in wafer substrate reflectivity. The arrangement includes providing substrate illumination and then adjusting the illumination on the substrate. The arrangement also includes controlling the dispensation of material over the substrate as a function of the adjusted illumination. By compensating for variations in wafer substrate reflectivity, manufacturing processes can realize more consistent photoresist coatings on wafer substrates from one wafer lot to another.
申请公布号 US2002029744(A1) 申请公布日期 2002.03.14
申请号 US20010990991 申请日期 2001.11.16
申请人 VLSI TECHNOLOGY, INC. (KONINKLIJKE PHILIPS ELECTRONICS N.V.). 发明人 BAKER DANIEL C.
分类号 G01B11/06;G03F7/16;H01L21/027;H01L21/312;(IPC1-7):B05C5/00 主分类号 G01B11/06
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