Testing integrated semiconducting circuit involves connecting monitor circuit to data pins and simultaneously evaluating state of semiconducting circuit in monitor circuit

摘要

The circuit has at least one pad (4) to which a monitoring circuit of a tester (3) can be connected and a number of data pins via which data can be written into the circuit (1) and read out of it. The method involves connecting the monitor circuit (5) to the data pins (DQ1-DQ16) and simultaneously evaluating the state of the semiconducting circuit in the monitor circuit.