发明名称 |
SEMICONDUCTOR DEVICE HAVING GATE ELECTRODE OF STACKED STRUCTURE INCLUDING POLYSILICON LAYER AND METAL LAYER AND METHOD OF MANUFACTURING THE SAME |
摘要 |
The present invention provides a semiconductor device, comprising a gate electrode of a stacked structure consisting of a polysilicon layer and a metal layer, a cap insulating film formed on the gate electrode, and a gate side wall film formed on the side wall of the gate electrode. The cap insulating film consists of an insulating film containing a silicon oxide-based layer and a silicon nitride layer and serves to protect the upper surface of the gate electrode. Further, the gate side wall film consists of an insulating film containing a silicon nitride film and a silicon oxide film and serves to protect the side surface of the gate electrode.
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申请公布号 |
US2002030234(A1) |
申请公布日期 |
2002.03.14 |
申请号 |
US19990414824 |
申请日期 |
1999.10.08 |
申请人 |
OHUCHI KAZUYA;AZUMA ATSUSHI |
发明人 |
OHUCHI KAZUYA;AZUMA ATSUSHI |
分类号 |
H01L29/78;H01L21/28;H01L21/318;H01L21/336;H01L21/60;(IPC1-7):H01L31/119;H01L31/113;H01L29/94 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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