发明名称 SEMICONDUCTOR DEVICE HAVING GATE ELECTRODE OF STACKED STRUCTURE INCLUDING POLYSILICON LAYER AND METAL LAYER AND METHOD OF MANUFACTURING THE SAME
摘要 The present invention provides a semiconductor device, comprising a gate electrode of a stacked structure consisting of a polysilicon layer and a metal layer, a cap insulating film formed on the gate electrode, and a gate side wall film formed on the side wall of the gate electrode. The cap insulating film consists of an insulating film containing a silicon oxide-based layer and a silicon nitride layer and serves to protect the upper surface of the gate electrode. Further, the gate side wall film consists of an insulating film containing a silicon nitride film and a silicon oxide film and serves to protect the side surface of the gate electrode.
申请公布号 US2002030234(A1) 申请公布日期 2002.03.14
申请号 US19990414824 申请日期 1999.10.08
申请人 OHUCHI KAZUYA;AZUMA ATSUSHI 发明人 OHUCHI KAZUYA;AZUMA ATSUSHI
分类号 H01L29/78;H01L21/28;H01L21/318;H01L21/336;H01L21/60;(IPC1-7):H01L31/119;H01L31/113;H01L29/94 主分类号 H01L29/78
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