发明名称 |
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
摘要 |
A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the shortcircuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
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申请公布号 |
US2002030507(A1) |
申请公布日期 |
2002.03.14 |
申请号 |
US20010944509 |
申请日期 |
2001.08.30 |
申请人 |
FARNWORTH WARREN M.;WALLER WILLIAM K.;NEVILL LELAND R.;BEFFA RAYMOND J.;CLOUD EUGENE H. |
发明人 |
FARNWORTH WARREN M.;WALLER WILLIAM K.;NEVILL LELAND R.;BEFFA RAYMOND J.;CLOUD EUGENE H. |
分类号 |
G01R31/28;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/28 |
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