发明名称 Defect detecting apparatus
摘要 A defect detecting apparatus comprising an illuminating unit which irradiates an object with illumination an image sensing unit which senses an image of the object an angle controller which controls an inclination angle of at least one of the illuminating unit and the image sensing unit, an image processor which senses images of the object while the angle controller changes the inclination angle of at least one of the illuminating unit and the image sensing unit and obtains a relationship between each inclination angle and optical information corresponding to the each inclination angle, and a determination unit which determines an image sensing condition suited to observation in accordance with the relationship wherein the angle controller sets the inclination angle of the illuminating unit or the image sensing unit on the basis of a determination result from the determination unit such that the inclination angle matches the image sensing condition.
申请公布号 US2002031249(A1) 申请公布日期 2002.03.14
申请号 US20010989923 申请日期 2001.11.21
申请人 OLYMPUS OPTICAL CO., LTD. 发明人 KOMURO TAKAHIRO;TSUJI HARUYUKI;MIURA YASUTADA;TANAKA TOSHIHIKO
分类号 G01N21/95;G01N21/956;H01L21/00;H01L21/66;(IPC1-7):G06K9/00 主分类号 G01N21/95
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