| 摘要 |
PROBLEM TO BE SOLVED: To reduce a load for a test pattern preparing work for new circuit, when a circuit is changed. SOLUTION: By using a port terminal name and a pin attribute, a circuit change portion is specified, and the contents of correction are classified for each path in a path classification process S4, and the contents of correction of the circuit are materialized and classified in a correction content classification process S5. In the content of correction capable of automatically correcting a test pattern, a test pattern file for a new circuit is prepared automatically, based on a test pattern for old circuit. When correction automatic correction is disabled, only format correction of pin definition is performed, a test pattern format is prepared, and a port terminal name requiring the examination of a test pattern value is fed back to the operator. The operator examines the test pattern based on the information, prepares the pattern value, and completes the test pattern file for new circuit.
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