发明名称 Micrometer
摘要 A micrometer (1) includes an anvil (3) and a spindle (4) having a flat plate-like distal end. The anvil (3) includes a small-diameter pin (3C) of a predetermined length formed on a distal end portion of a rod-like anvil body (3A), and a detection portion (5) of a tubular shape fitted on the anvil body (3A) to be slidably moved along the anvil body (3A), a distal end of the detection portion (5) being formed into a plate-like shape, a pin insertion hole being formed in a central portion of the distal end of the detection portion (5), and the pin being inserted in the pin insertion hole. The anvil (3) further includes a dial gauge (10) which is contacted at its distal end with the detection portion (5), and indicates a plus value and a minus value in accordance with the movement of the detection portion (5). The distal end of the anvil (3) is abutted against the distal end of the spindle (4), and when a distal end of the pin (3C) of the anvil (3) coincides with the distal end of the detection portion (5), the dial gauge (10) is set to a zero point. An object (11) to be measured is inserted between the anvil (3) and the spindle (4), and when the distal end of the anvil (3) is brought into abutting engagement with the object to be measured, it is detected from the amount of movement of the detection portion (5) relative to the pin of the anvil body (3A) whether the object to be measured is an appropriate one.
申请公布号 US6354014(B1) 申请公布日期 2002.03.12
申请号 US20000525853 申请日期 2000.03.14
申请人 YAZAKI CORPORATION 发明人 YAMAKAWA NOBUAKI;KUDO SHIGEJI
分类号 G01B3/18;(IPC1-7):G01B3/18 主分类号 G01B3/18
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