发明名称 Multi-port programmable tester
摘要 A multi-port programmable analog tester for testing an analog device having more than two test ports includes a two-port network analyzer having two network analyzer ports and an interface device coupled to the network analyzer. The interface device has at least two levels of switches, and is adapted to be coupled to the test ports of the analog device.
申请公布号 US6356852(B1) 申请公布日期 2002.03.12
申请号 US19990368029 申请日期 1999.08.03
申请人 LUCENT TECHNOLOGIES, INC. 发明人 KE MENG-KUN
分类号 G01R27/28;(IPC1-7):G01R31/04 主分类号 G01R27/28
代理机构 代理人
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