发明名称 |
METHOD FOR MONITORING MANUFACTURING DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To accurately evaluate the influence of an operation stop of a manufacturing device on the manufacturing state of a product. SOLUTION: A 1st influence degree is calculated from the value obtained by subtracting the number of products in a processing wait state at a manufacturing device at a specific point of time before the manufacturing device stops operating from the number of products in a processing wait state at the manufacturing device at a specific point of time after the manufacturing device restarts operating after stopping operating and a 2nd influence degree is calculated from the value obtained by subtracting the time of the processing wait of products having been processed by the manufacturing device in a specific period before the manufacturing device stops operating from the time of the processing wait state of produces having been processed by the manufacturing device for a specific period after the manufacturing device restarts operating after stopping operating. The influence of the stop is evaluated according to the 1st influence degree and 2nd influence degree.</p> |
申请公布号 |
JP2002073143(A) |
申请公布日期 |
2002.03.12 |
申请号 |
JP20000255644 |
申请日期 |
2000.08.25 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MATSUMOTO SHIGERU |
分类号 |
G05B19/418;G05B23/02;G06Q50/00;G06Q50/04;H01L21/02;(IPC1-7):G05B19/418;G06F17/60 |
主分类号 |
G05B19/418 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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