BURN-IN TESTING DEVICE AND METHOD, AND STORAGE MEDIUM

摘要

PROBLEM TO BE SOLVED: To perform a test by one burn-in test using one kind of a burn-in board even with respect to a case performing the burn-in test of an IC requiring the arrangement of a plurality of pins. SOLUTION: A macroprogram for indicating the practice order of a plurality of test programs and the pin condition corresponding to a plurality of the test programs are stored in a memory 32. A CPU 31 reads the test programs from the memory 32 in the indicated order according to the macroprogram and also sets the pin condition to allow a pattern control part 2 to perform the test content thereof. The CPU 31 forms one file wherein respective test results are collected.