发明名称 PROBE PIN FOR PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a probe pin which achieves a lager bending strength and a higher electric conductivity. SOLUTION: A copper-silver alloy is used with the silver content thereof of 1 to 25 atomic % to hold the tensile strength thereof in the range of 1,000 to 1,500 MPa while the electric conductivity is specified in the range of 60-90% IACS. In the probe pin 1 comprising a straight part 2 and a tapered part 3, the crack and breaking of a bent part 4 as caused by the bending work of the pin tip can be prevented as much as possible.
申请公布号 JP2002071714(A) 申请公布日期 2002.03.12
申请号 JP20000262002 申请日期 2000.08.31
申请人 KANAI HIROAKI 发明人 KITAFUJI HIROTAKA;KIMORI YOSHIO;KAGEYAMA YOSHINOBU
分类号 G01R1/067;H01L21/66;(IPC1-7):G01R1/067 主分类号 G01R1/067
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