SEMICONDUCTOR TESTING DEVICE AND METHOD

摘要

PROBLEM TO BE SOLVED: To stably perform a test by preventing the flying-out of an IC during a test. SOLUTION: When ICs 1 are collectively tested in a state housed in a feed pallet 2, a windshield plate 7 for preventing the flying-out of the IC is used in a test part 3 to prevent the flying-out of the IC 1 from the positioning part on the way of push-up operation or the positional shift thereof to stably test the extremely small and lightweight IC 1.