| 摘要 |
PROBLEM TO BE SOLVED: To provide the test head of an IC tester facilitating the attachment and detachment of a DUT board and imparting good signal quality. SOLUTION: This invention relates to the improvement in the test head of the IC tester loaded with a performance board and the DUT board electrically connected to an object to be tested. This apparatus has the receptacle connector attached to the performance board and is provided with the first contact pin electrically connected to the performance board, the second contact pin locked with the receptacle connector in a freely detachable manner and attached to the DUT board to be electrically connected thereto and the plug connector electrically connecting the second contact pin to the first contact pin by rotation and provided with the cam shaft fixed to the receptacle connector.
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