发明名称 PHOTOIRRADIATION DEVICE FOR THERMOELECTRIC MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To make a thermoelectric measuring instrument stably usable in a wide sample temperature range by making the adjustment of its optical axis easier by intercepting background light by passing a laser beam having a specific wavelength through an interference filter when the laser beam is projected upon a sample. SOLUTION: The laser beam 12 emitted from a light source 10 advances downward after the beam 12 is reflected by a reflection mirror 14 at a right angle. Below the mirror 14, a shutter 16 and the interference filter 18 are arranged. The shutter 16 can rotate around a horizontal rotating shaft and, accordingly, can be switched between horizontal and vertical attitudes. When the shutter 16 is in the horizontal attitude, the shutter 16 intercepts the laser beam and, when the shutter 16 is in the vertical attitude, the shutter 16 causes the laser beam to go through. After passing through the interference filter 18, the laser beam is projected upon the sample 20 supported under a TSC measuring instrument 30 or its vicinity. When the laser beam is projected upon the sample 20 through the filter 18, only part of the laser beam having a wavelength of about 680 nm is projected upon the sample 20 and the background light is intercepted by the filter 18.
申请公布号 JP2002071598(A) 申请公布日期 2002.03.08
申请号 JP20000259892 申请日期 2000.08.29
申请人 RIGAKU CORP 发明人 HIRAYAMA YASUO;MATSUO SHUICHI;INAMI MASANOBU
分类号 G01N25/00;(IPC1-7):G01N25/00 主分类号 G01N25/00
代理机构 代理人
主权项
地址