发明名称 X-RAY FOREIGN-MATTER INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an X-ray foreign-matter inspection device which can prevent the leakage of X rays to the outside from the inspection device caused by the misoperation of an X-ray source 3 when the inspection device is partially opened and, accordingly, the X rays are unshielded. SOLUTION: This X-ray foreign-matter inspection device inspects an article M with X rays from the X-ray source 2 for foreign matters contained in the article M while the article M is carried on a transportation conveyor 2. The device is provided with an open detector 4 which detects that the inspection device is partially opened and X rays are externally unshielded, and a projection stopping means 6 which stops the projection of the X rays from the X-ray source 3 based on the unshielded state of the X rays detected by means of the detector 4.</p>
申请公布号 JP2002071588(A) 申请公布日期 2002.03.08
申请号 JP20000266525 申请日期 2000.09.04
申请人 ISHIDA CO LTD 发明人 UNO MASAYUKI;KABUMOTO TAKASHI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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