发明名称 APPARATUS FOR FABRICATING III-V NITRIDE FILM AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A method for fabricating a III-V nitride film is provided to fabricate the III-V nitride film including at least an aluminum element by a hydride vapor phase epitaxy(HVPE) method, by eliminating or reducing the influence of erosion caused by AlCl gas. CONSTITUTION: A hydrogen chloride gas and an ammonia gas are introduced with a carrier gas into a reactor in which a substrate and at least an aluminum metallic material through conduits. The hydrogen gas and the ammonia gas are heated by heater. A III-V nitride film including at least Al element is epitaxially grown on the substrate by using an HVPE method. The whole of the reactor is made of an aluminum nitride material which does not suffer from the corrosion of an aluminum chloride gas generated by the reaction of an aluminum metallic material with a hydrogen chloride gas.
申请公布号 KR20020018557(A) 申请公布日期 2002.03.08
申请号 KR20010050586 申请日期 2001.08.22
申请人 NGK INSULATORS, LTD. 发明人 ASAI KEIICHIRO;SHIBATA TOMOHIKO;TANAKA MITSUHIRO
分类号 C30B25/08;C30B25/02;C30B25/16;C30B29/38;H01L21/20;H01L21/205;(IPC1-7):H01L21/20 主分类号 C30B25/08
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