| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method capable of easily qualitatively analyzing metallic elements in an electric brush in a short time. SOLUTION: In this method, the surface of the electric brush is precisely polished to >=#1000 and the polished surface is irradiated with an electron beam. Then, the quantities of the metallic elements contained in the brush are determined by measuring generated X rays. Consequently, a more accurate Cu value can be obtained.</p> |
