发明名称 BAKING APPARATUS USED IN FABRICATING SEMICONDUCTOR
摘要 PURPOSE: A baking apparatus used in fabricating a semiconductor is provided to increase operation efficiency by eliminating contaminant by a sensing process without using a periodical method, and to improve reliability by minimizing the contaminant absorbed to a substrate. CONSTITUTION: A substrate to be heated to a predetermined temperature is placed on a lower plate(14), installed under a case(10). A pin(16) supports the substrate placed on the lower plate, penetrating the lower plate. An upper plate(12) is installed in an upper portion confronting the lower plate in the case. A sensing unit(30) senses that the contaminant generated in heating the substrate to a predetermined temperature is absorbed to the inside of the case including the lower and upper plates, installed in the lower and upper plates, respectively.
申请公布号 KR20020018482(A) 申请公布日期 2002.03.08
申请号 KR20000051807 申请日期 2000.09.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, HYEONG SEOK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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