发明名称 STRUCTURE FOR PREVENTING LEAKAGE OF MICROWAVE IN SEMICONDUCTOR FABRICATING EQUIPMENT
摘要 PURPOSE: A structure for preventing a leakage of microwave in semiconductor fabricating equipment is provided to perform stably processes by preventing an error due to a leakage of microwave. CONSTITUTION: The first ring(R1) for preventing a leakage of microwave is installed in a combination portion between the first equipment(E1) and the second equipment(E2). The second ring(R2) for preventing the leakage of microwave is installed in a combination portion between the first equipment(E1) and the third equipment(E2). The first to the third equipment(E1-E3) are used for shifting microwave wavelengths. The first ring(R1) and the second ring(R2) can be formed with a cooper material. In addition, the first ring(R1) and the second ring(R2) can be formed with a mixture of the cooper and an asbestos.
申请公布号 KR20020016991(A) 申请公布日期 2002.03.07
申请号 KR20000050028 申请日期 2000.08.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG YUN
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
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