发明名称 |
STRUCTURE FOR PREVENTING LEAKAGE OF MICROWAVE IN SEMICONDUCTOR FABRICATING EQUIPMENT |
摘要 |
PURPOSE: A structure for preventing a leakage of microwave in semiconductor fabricating equipment is provided to perform stably processes by preventing an error due to a leakage of microwave. CONSTITUTION: The first ring(R1) for preventing a leakage of microwave is installed in a combination portion between the first equipment(E1) and the second equipment(E2). The second ring(R2) for preventing the leakage of microwave is installed in a combination portion between the first equipment(E1) and the third equipment(E2). The first to the third equipment(E1-E3) are used for shifting microwave wavelengths. The first ring(R1) and the second ring(R2) can be formed with a cooper material. In addition, the first ring(R1) and the second ring(R2) can be formed with a mixture of the cooper and an asbestos.
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申请公布号 |
KR20020016991(A) |
申请公布日期 |
2002.03.07 |
申请号 |
KR20000050028 |
申请日期 |
2000.08.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DONG YUN |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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