发明名称 METHOD FOR FORMING PHASE SHIFT MASK
摘要 PURPOSE: Provided is a method for forming an edge emphasized phase shift mask, which improves the yield and the productivity of semiconductor elements, therefore, it can integrate highly the semiconductor elements. CONSTITUTION: The method comprises the steps of: forming a chromium layer(23) on a quartz substrate(21); etching the chromium layer(23) to form the patterns of the chromium layer(23); forming a material layer for spacer on the whole surface containing the patterns of the chromium layer(23), wherein the material layer for spacer is a chromium layer(27) or a phase shift layer; etching the whole surface of the material layer for spacer by a dry method to form the spacer on the side wall of the patterns of the chromium layer(23).
申请公布号 KR20020017847(A) 申请公布日期 2002.03.07
申请号 KR20000051362 申请日期 2000.08.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BANG, CHANG JIN;HAN, MIN SEOP
分类号 G03F1/26 主分类号 G03F1/26
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