发明名称 |
METHOD OF THINNING SEMICONDUCTOR WAFER CAPABLE OF PREVENTING ITS FRONT FROM BEING CONTAMINATED AND BACK GRINDING DEVICE FOR SEMICONDUCTOR |
摘要 |
PURPOSE: A method of thinning a semiconductor wafer is provided to enhance the quality and reliability of a semiconductor device by eliminating the contamination of the wafer surface. CONSTITUTION: A protection tape smaller in size than the semiconductor wafer is applied to a front of the semiconductor wafer, and a back of the semiconductor wafer is etched. In the etching process, a chemical liquid falls down from the semiconductor wafer without being accumulated on the protection tape because the protection tape is smaller in size than the semiconductor wafer.
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申请公布号 |
KR20020017929(A) |
申请公布日期 |
2002.03.07 |
申请号 |
KR20010030195 |
申请日期 |
2001.05.30 |
申请人 |
SHARP CORPORATION |
发明人 |
FUKUNAGA SATORU;INTO TADAYUKI;IWASAKI NORIKI |
分类号 |
H01L21/302;B24B41/06;H01L21/306;H01L21/68;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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