发明名称 METHOD OF THINNING SEMICONDUCTOR WAFER CAPABLE OF PREVENTING ITS FRONT FROM BEING CONTAMINATED AND BACK GRINDING DEVICE FOR SEMICONDUCTOR
摘要 PURPOSE: A method of thinning a semiconductor wafer is provided to enhance the quality and reliability of a semiconductor device by eliminating the contamination of the wafer surface. CONSTITUTION: A protection tape smaller in size than the semiconductor wafer is applied to a front of the semiconductor wafer, and a back of the semiconductor wafer is etched. In the etching process, a chemical liquid falls down from the semiconductor wafer without being accumulated on the protection tape because the protection tape is smaller in size than the semiconductor wafer.
申请公布号 KR20020017929(A) 申请公布日期 2002.03.07
申请号 KR20010030195 申请日期 2001.05.30
申请人 SHARP CORPORATION 发明人 FUKUNAGA SATORU;INTO TADAYUKI;IWASAKI NORIKI
分类号 H01L21/302;B24B41/06;H01L21/306;H01L21/68;(IPC1-7):H01L21/302 主分类号 H01L21/302
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