| 摘要 |
Alignment marks and a method of forming the alignment marks are provided. The method includes the steps of forming a first alignment mark in an alignment mark forming area on the substrate, forming an opaque layer that is opaque to the alignment light above the alignment mark forming area where the first alignment mark is formed, substantially flattening a surface of the opaque layer, and forming a second alignment mark on a side where the alignment light is incident with respect to the flattened opaque layer.
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