发明名称 DIGITIZER AND SEMICONDUCTOR TEST INSTRUMENT
摘要 <p>An interleaving AD conversion waveform digitizer in which the digitizer comprises N AD converters (N is two or more integer) having N interleaving phases and interconnected in an interleaving structure, the sampling of each AD converter is carried out at predetermined timing corresponding to the interleaving structure, digital signals are continuously outputted, the measurement signal outputted from a device to be measured is quantized, and time-series data from the AD converters is Fourier-transformed by butterfly calculation, characterized by comprising a window function multiplying section for determining a coefficient on the basis of the phase error and a butterfly calculation section for performing butterfly calculation by inserting a phase error correction coefficient.</p>
申请公布号 WO2002018966(P1) 申请公布日期 2002.03.07
申请号 JP2001007466 申请日期 2001.08.30
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