发明名称 |
METHOD AND APPARATUS FOR CONTROLLING PLASMA ETCH |
摘要 |
PURPOSE: A method for controlling plasma etch is provided to reduce damage in an etch process and to modify an etch rate, by performing a phase inversion from an oscillator having radio frequency in a chamber to which the radio frequency is applied by a phase split so that different power having inverted phases is supplied to upper and lower electrodes. CONSTITUTION: A radio frequency waveform of a reference frequency is converted by an inverted phase to independently output frequencies having an inversion phase difference. A single set-up power is ratio-controlled and outputted. Each ratio-controlled power having each frequency of the inversion phase difference is applied to the upper and lower electrodes(38,39).
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申请公布号 |
KR20020017271(A) |
申请公布日期 |
2002.03.07 |
申请号 |
KR20000050483 |
申请日期 |
2000.08.29 |
申请人 |
MECCATECHS CO., LTD.;RADIION TECH CO., LTD. |
发明人 |
JUNG, SANG GON |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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