发明名称 METHOD AND APPARATUS FOR CONTROLLING PLASMA ETCH
摘要 PURPOSE: A method for controlling plasma etch is provided to reduce damage in an etch process and to modify an etch rate, by performing a phase inversion from an oscillator having radio frequency in a chamber to which the radio frequency is applied by a phase split so that different power having inverted phases is supplied to upper and lower electrodes. CONSTITUTION: A radio frequency waveform of a reference frequency is converted by an inverted phase to independently output frequencies having an inversion phase difference. A single set-up power is ratio-controlled and outputted. Each ratio-controlled power having each frequency of the inversion phase difference is applied to the upper and lower electrodes(38,39).
申请公布号 KR20020017271(A) 申请公布日期 2002.03.07
申请号 KR20000050483 申请日期 2000.08.29
申请人 MECCATECHS CO., LTD.;RADIION TECH CO., LTD. 发明人 JUNG, SANG GON
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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