发明名称 |
METHOD FOR PROVIDING BITWISE CONSTRAINTS FOR TEST GENERATION |
摘要 |
A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly "solve" the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. |
申请公布号 |
WO0219108(A2) |
申请公布日期 |
2002.03.07 |
申请号 |
WO2001IL00803 |
申请日期 |
2001.08.28 |
申请人 |
VERISITY LTD.;LAGOON, VITALY;BARRUCH, GUY |
发明人 |
LAGOON, VITALY;BARRUCH, GUY |
分类号 |
G06F17/50;G01R31/28;G01R31/3183;G06F;G06F11/00;G06F11/22;G06F17/10 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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