发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE AND WAFER TREATMENT APPARATUS EMPLOYED THEREFOR AS WELL AS SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of fabricating a semiconductor device is provided to attain high selectivity in etching, and a wafer treatment apparatus is provided to be employed for such a method of fabricating a semiconductor device. CONSTITUTION: In the wafer treatment apparatus, a hydrofluoric acid gas supply pipe and an evacuation pipe are connected to a chamber storing a wafer for performing prescribed treatment. A control part controls supply of hydrofluoric acid gas. The control part sets a time for supplying the hydrofluoric acid gas into the chamber to be longer than a time up to starting of etching of a reaction product and shorter than a time up to starting of etching of a gate insulator film. Thus, only the reaction product can be substantially etched without etching the gate insulator film.
申请公布号 KR20020018022(A) 申请公布日期 2002.03.07
申请号 KR20010051728 申请日期 2001.08.27
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OOTERA HIROKI;SHINTANI KENJI;TAKI MASAKAZU;TSUDA MUTSUMI
分类号 H01L21/304;C09K13/08;C23F11/04;H01L21/28;H01L21/302;H01L21/3065;H01L21/3213;H01L29/78;(IPC1-7):H01L21/304 主分类号 H01L21/304
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