发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE AND WAFER TREATMENT APPARATUS EMPLOYED THEREFOR AS WELL AS SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of fabricating a semiconductor device is provided to attain high selectivity in etching, and a wafer treatment apparatus is provided to be employed for such a method of fabricating a semiconductor device. CONSTITUTION: In the wafer treatment apparatus, a hydrofluoric acid gas supply pipe and an evacuation pipe are connected to a chamber storing a wafer for performing prescribed treatment. A control part controls supply of hydrofluoric acid gas. The control part sets a time for supplying the hydrofluoric acid gas into the chamber to be longer than a time up to starting of etching of a reaction product and shorter than a time up to starting of etching of a gate insulator film. Thus, only the reaction product can be substantially etched without etching the gate insulator film.
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申请公布号 |
KR20020018022(A) |
申请公布日期 |
2002.03.07 |
申请号 |
KR20010051728 |
申请日期 |
2001.08.27 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
OOTERA HIROKI;SHINTANI KENJI;TAKI MASAKAZU;TSUDA MUTSUMI |
分类号 |
H01L21/304;C09K13/08;C23F11/04;H01L21/28;H01L21/302;H01L21/3065;H01L21/3213;H01L29/78;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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