发明名称 METHOD FOR PRODUCING HIGH PERFORMANCE SiGe HETERO- JUNCTION BIPOLAR TRANSISTOR BiCMOS ON SILICON ON INSULATOR
摘要 PURPOSE: A high performance SiGe hetero-junction bipolar transistor BiCMOS on a silicon wafer on an insulator for achieving the performance of SiGe HBT is provided. CONSTITUTION: A semiconductor structure is provided with an SOI wafer, the CMOS formed on the wafer and the SiGe HBT formed on the wafer. In the method for producing the semiconductor structure, this method includes a process for controlling the SOI wafer having a plurality of active areas thereon, a process for forming the CMOS in the first active area on the wafer, and a process for forming the SiGe HBT in the other active area on the wafer.
申请公布号 KR20020018056(A) 申请公布日期 2002.03.07
申请号 KR20010052045 申请日期 2001.08.28
申请人 SHARP CORPORATION 发明人 HON IN;SHIEN TEN SUU;TWEET DOUGLAS JAMES;ULRICH BRUCE DALE
分类号 H01L21/331;H01L21/76;H01L21/762;H01L21/8222;H01L21/8248;H01L21/8249;H01L21/84;H01L27/06;H01L27/08;H01L27/10;H01L27/12;H01L29/737;H01L29/786;(IPC1-7):H01L27/10 主分类号 H01L21/331
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