发明名称 |
METHOD FOR FORMING FERROELECTRIC MEMORY DEVICE CAPABLE OF PREVENTING OXIDATION OF LOWER ELECTRODE |
摘要 |
PURPOSE: A method for forming a ferroelectric memory device capable of preventing oxidation of a lower electrode is provided to control an increase of contact resistance, by preventing a plug polysilicon layer from being oxidized. CONSTITUTION: A ferroelectric layer(24) is formed on the lower electrode(23). The first heat treatment process is performed in an activated plasma state and in an oxygen atmosphere to induce oxygen to the inside of the ferroelectric layer. The second heat treatment process is performed in a nitrogen atmosphere to crystallize the ferroelectric layer. An upper electrode(25) is formed on the ferroelectric layer.
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申请公布号 |
KR20020017749(A) |
申请公布日期 |
2002.03.07 |
申请号 |
KR20000051262 |
申请日期 |
2000.08.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, NAM GYEONG;YUM, SEUNG JIN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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