发明名称 APPARATUS AND METHOD FOR CLEANING SUBSTRATE
摘要 PURPOSE: An apparatus for cleaning a substrate is provided to more efficiently clean the entire surface of a wafer within a short interval of time without re-applying contamination, which has been once removed from the surface of the substrate, to the surface of the substrate again, by using two different scrub heads. CONSTITUTION: The first scrub head(31) is superior to the second scrub head(32) in terms of a capability of removing contamination. The second scrub head has a low level of adhesion to the contamination as compared with the first scrub head. The first and second scrub heads are moved such that the second scrub head follows the first scrub head.
申请公布号 KR20020018042(A) 申请公布日期 2002.03.07
申请号 KR20010051938 申请日期 2001.08.28
申请人 TOKYO ELECTRON LIMITED 发明人 NAN KAZUYOSHI
分类号 G02F1/13;B08B1/04;B08B3/04;B08B7/04;G02F1/1333;H01L21/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 G02F1/13
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