发明名称 METHOD FOR FORMING CONTACT IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact in a semiconductor device is provided to improve reliability and properties of devices by forming fine contact using an additional pad mask. CONSTITUTION: A word line, a junction region and the first insulating spacer are sequentially formed on a semiconductor substrate. The second insulating layer is formed on the resultant structure and the second insulating layer is formed so as to planarize the resultant structure. A pad thin film is formed on the third insulating layer in order to overlap the word line. After forming a photoresist pattern on the resultant structure, a contact hole(27) is formed to expose the junction region using the photoresist pattern and the pad thin film as a mask. A conductive layer(29) is formed to contact the junction region via the contact hole(27). At the time, conductive material having a high etching selectivity compared to the insulating layer, is used as the pad thin film.
申请公布号 KR100329070(B1) 申请公布日期 2002.03.06
申请号 KR19950004721 申请日期 1995.03.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, CHEOL SU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
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