发明名称 Method for forming an isolation trench in a SOI substrate
摘要 <p>In a semiconductor layer (203) formed on a first insulating film (204) is formed an element isolation groove extending to the first insulating film. Thereafter, a second insulating film (209) is deposited in the element isolation groove by using a vapor deposition method. <IMAGE></p>
申请公布号 EP1184902(A1) 申请公布日期 2002.03.06
申请号 EP20010120911 申请日期 2001.08.30
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ARITA, KOJI;UEMOTO, YASUHIRO
分类号 H01L21/02;H01L21/76;H01L21/762;H01L27/08;H01L27/12;(IPC1-7):H01L21/762;H01L21/763 主分类号 H01L21/02
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