发明名称 IGBT PROCESS USING PLATINUM FOR LIFETIME CONTROL
摘要 <p>A process for making a MOS-type insulated gate controlled power switching device (10) is characterized by the formation of an insulated gate contact layer (30) and a source contact layer (28) patterned to form a plurality of complementary, parallel, interdigitated gate and source fingers (116A,118), a gate bus (113,114) interconnecting the gate fingers (116A), and at least one source bus and pad (117, 116) connected to the source fingers (118). Body regions (22) are spaced across a drain region (20) at a first lateral spacing L1 beneath the gate fingers (116A) and at a second spacing L2 greater than the first spacing L1 beneath the gate bus (113, 114). The body regions (22) form a breakdown prone region beneath the gate bus (113,114) and the process further includes doping a portion of the breakdown prone region. <IMAGE></p>
申请公布号 EP0601093(B1) 申请公布日期 2002.03.06
申请号 EP19920919301 申请日期 1992.08.27
申请人 ADVANCED POWER TECHNOLOGY INC. 发明人 PIKE, DOUGLAS, A., JR.;TSANG, DAH, WEN;KATANA, JAMES, M.;SDRULLA, DUMITRU
分类号 H01L21/322;H01L21/033;H01L21/22;H01L21/266;H01L21/3065;H01L21/331;H01L21/336;H01L29/06;H01L29/10;H01L29/40;H01L29/417;H01L29/739;H01L29/74;H01L29/745;H01L29/749;H01L29/78;(IPC1-7):H01L21/22;H01L23/29;H01L21/316;H01L29/72;H01L21/265 主分类号 H01L21/322
代理机构 代理人
主权项
地址