发明名称 |
PROCESSING DEVICE OF SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To restrict a suction of a processing liquid such as a coolant to a negative pressure system for adsorbing a wafer in a processing device of semi conductor wafer constituted such that the wafer is suctioned and retained on a rotation table by a negative pressure. SOLUTION: An adsorption pad 5 formed by a porous material so as to adsorb a semiconductor wafer 1 is coaxially buried on an upper surface part of the rotation table 2 so as to constituted an upper surface of the rotation table 2. A negative pressure passage 15 for acting a suction negative pressure over a whole lower surface of the adsorption pad 5 is provided in the rotation table 2. The rotation table 2 is constituted such that a pressurized air is upwardly injected from a released upper surface of the adsorption pad 5 including a border of an outer periphery of the wafer 1. |
申请公布号 |
JP2002066912(A) |
申请公布日期 |
2002.03.05 |
申请号 |
JP20000262400 |
申请日期 |
2000.08.31 |
申请人 |
NIPPEI TOYAMA CORP |
发明人 |
OKUYAMA TETSUO;SAIDA KUNIHIRO;MURAI SHIRO |
分类号 |
B23Q3/08;B24B37/30;H01L21/304 |
主分类号 |
B23Q3/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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