发明名称 PROCESSING DEVICE OF SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To restrict a suction of a processing liquid such as a coolant to a negative pressure system for adsorbing a wafer in a processing device of semi conductor wafer constituted such that the wafer is suctioned and retained on a rotation table by a negative pressure. SOLUTION: An adsorption pad 5 formed by a porous material so as to adsorb a semiconductor wafer 1 is coaxially buried on an upper surface part of the rotation table 2 so as to constituted an upper surface of the rotation table 2. A negative pressure passage 15 for acting a suction negative pressure over a whole lower surface of the adsorption pad 5 is provided in the rotation table 2. The rotation table 2 is constituted such that a pressurized air is upwardly injected from a released upper surface of the adsorption pad 5 including a border of an outer periphery of the wafer 1.
申请公布号 JP2002066912(A) 申请公布日期 2002.03.05
申请号 JP20000262400 申请日期 2000.08.31
申请人 NIPPEI TOYAMA CORP 发明人 OKUYAMA TETSUO;SAIDA KUNIHIRO;MURAI SHIRO
分类号 B23Q3/08;B24B37/30;H01L21/304 主分类号 B23Q3/08
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