发明名称 Multilayer film structure with high tunneling magneto-resistance ratio and the manufacturing method of the same
摘要 This specification disclosed a multilayer film structure of a tunneling magneto-resistor and the manufacturing of the same, the structure being able to increase the tunneling magneto-resistance (TMR) ratio and to decrease the difficulty in manufacturing. The multilayer film structure disclosed herein forms, in a three-layer film structure composed of two layers of ferromagnetic films and an insulating layer provided in between, a layer of moderately thick ferromagnetic metal insertion between one of the ferromagnetic film and the insulating layer. Through the insertion the tunneling magneto-resistance ratio can be greatly increased and the thickness of the insulating layer is increased to the range where the manufacturing difficulty is lowered.
申请公布号 US2002025619(A1) 申请公布日期 2002.02.28
申请号 US20000745154 申请日期 2000.12.19
申请人 LO CHI-KUEN;HO CHIA-HWO;LIN MINN-TSONG;YAO YEONG-DER;HUANG DER-RAY 发明人 LO CHI-KUEN;HO CHIA-HWO;LIN MINN-TSONG;YAO YEONG-DER;HUANG DER-RAY
分类号 B32B7/02;B32B15/04;H01L27/08;(IPC1-7):H01L21/823 主分类号 B32B7/02
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