发明名称 |
POLISHING APPARATUS COMPRISING PAD AND POLISHING METHOD USING THE SAME |
摘要 |
A chemical polishing apparatus which self-supplies a polishing chemical from a polishing pad, and a polishing method using the chemical polishing apparatus are provided. This chemical polishing apparatus, which is used to polish a material film formed on a wafer in the manufacture of semiconductor devices, includes a wafer head, to the bottom surface of which a wafer is sucked, the wafer head capable of uniformly maintaining the temperature of the wafer and a pressure applied to the rear surface of the wafer throughout polishing, a cooling pad which faces the wafer head and self-supplies a polishing chemical during polishing, a cooling vessel which surrounds the bottom and lateral sides of the cooling pad, a cooling unit which is attached to the bottom surface of the cooling pad and used to form and maintain the cooling pad, and a chamber which accommodates the above-described members, and is maintained in a wafer-free state. |
申请公布号 |
WO0217411(A1) |
申请公布日期 |
2002.02.28 |
申请号 |
WO2000KR01030 |
申请日期 |
2000.09.09 |
申请人 |
FINE SEMITECH CO., LTD.;PARK, SUNG-YONG;CHUNG, CHAN-HWA;YOON, SUNG-JOON |
发明人 |
PARK, SUNG-YONG;CHUNG, CHAN-HWA;YOON, SUNG-JOON |
分类号 |
H01L21/302;B24B37/04;B24B49/14;H01L21/306;H01L21/3105;H01L21/321 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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