发明名称 POLISHING APPARATUS COMPRISING PAD AND POLISHING METHOD USING THE SAME
摘要 A chemical polishing apparatus which self-supplies a polishing chemical from a polishing pad, and a polishing method using the chemical polishing apparatus are provided. This chemical polishing apparatus, which is used to polish a material film formed on a wafer in the manufacture of semiconductor devices, includes a wafer head, to the bottom surface of which a wafer is sucked, the wafer head capable of uniformly maintaining the temperature of the wafer and a pressure applied to the rear surface of the wafer throughout polishing, a cooling pad which faces the wafer head and self-supplies a polishing chemical during polishing, a cooling vessel which surrounds the bottom and lateral sides of the cooling pad, a cooling unit which is attached to the bottom surface of the cooling pad and used to form and maintain the cooling pad, and a chamber which accommodates the above-described members, and is maintained in a wafer-free state.
申请公布号 WO0217411(A1) 申请公布日期 2002.02.28
申请号 WO2000KR01030 申请日期 2000.09.09
申请人 FINE SEMITECH CO., LTD.;PARK, SUNG-YONG;CHUNG, CHAN-HWA;YOON, SUNG-JOON 发明人 PARK, SUNG-YONG;CHUNG, CHAN-HWA;YOON, SUNG-JOON
分类号 H01L21/302;B24B37/04;B24B49/14;H01L21/306;H01L21/3105;H01L21/321 主分类号 H01L21/302
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