| 摘要 |
To provide a ferroelectric memory, in which data can be positively protected even in an event of fluctuations in process parameter, time can be shortened for a reliability estimation test, and it is possible to avoid device breakage resulted from the test. A source voltage VDD is detected by using a source voltage detection circuit having a stable detection level. When a detected voltage RREFA is at or lower than a set detection level VREFA, an external input terminal XEXTCE,is deactivated by using an output signal of a differential amplifier circuit to protect data. Thus, it is possible to protect data with stability.
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