| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory board test device which can perform a test by applying a test pattern signal from any connection part side in a memory board having such a structure that a plurality of memory chips are incorporated, these memory chips are connected in parallel and both ends of these connection lines being connected in parallel are connected to the connection parts of one side and the other side. SOLUTION: In a memory board to be tested, both of connection parts of one side and the other side are connected to a socket board and connected to a test device, a test pattern signal supply line and a response signal take-in line are connected to both of the connection parts, the test pattern signal can be supplied to any of the connection parts through the test pattern signal supply line and the response signal take-in line, and a response signal of a memory can be taken out from any of the connection parts.
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