发明名称 METHOD AND DEVICE FOR MANUFACTURING COLLOID PROBE
摘要 PROBLEM TO BE SOLVED: To easily manufacture a colloid probe excellent in measuring precision constituted by bonding a spherical sample particle onto a probe of an atomic force microscope. SOLUTION: This method has a process for positioning the probe of the atomic force microscope, a needle for applying an adhesive, and a needle for depositing the spherical sample particle in respective prescribed positions, a process for depositing the adhesive of the adhesive applying needle onto the probe of the atomic force microscope by returning the probe of the microscope to the prescribed position hereinbefore after the adhesive is applied on the adhesive applying needle in the condition where the probe of the atomic force microscope is separated from the adhesive applying needle, and a process for bonding the spherical sample particle onto the probe of the atomic force microscope by bringing the probe of the microscope into contact with the spherical sample particle depositing needle.
申请公布号 JP2002062253(A) 申请公布日期 2002.02.28
申请号 JP20000249131 申请日期 2000.08.21
申请人 KAMIYA HIDEHIRO;DENKI KAGAKU KOGYO KK 发明人 KAMIYA HIDEHIRO;YOSHIDA MASAYA;KOBAYASHI AKIRA
分类号 G01N19/04;G01Q60/24;G01Q60/28;G01Q60/38;G01Q60/42;(IPC1-7):G01N19/04;G01N13/16 主分类号 G01N19/04
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