| 摘要 |
A semiconductor integrated circuit capable of determining a configuration of a plurality of elements included in a functional block is provided. The semiconductor integrated circuit includes a memory functional block with a variable storage capacity, a functional block, and a terminal group for testing. A plurality of sub blocks are formed in the memory functional block when a chip is formed. Each of the plurality of sub blocks includes a determination circuit having substantially the same structure and function. A signal is input to the determination circuit from the terminal group, and a signal output through the determination circuit is observed at the terminal group. This enables determination of the configuration (the number, positional relationship, or the like) of the sub blocks.
|
