发明名称 LONG-OBJECT MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a long-object measuring apparatus which can obtain precise measured information on a long object as a whole and which can enhance the sorting accuracy of the long object. SOLUTION: The unnecessary part of a leek A which is placed on the mounting base 14 of a sorting conveyor 2 is cut off by an unnecessary-part cutting device 3, the saccharic acid level of the leek A is measured by a saccharic-acid-level measuring device 4, and the weight of the leek A is measured by a weight measuring device 5. The prescribed items in the stem part Aa, the soft white part Ab and the leaf part Ac of the leek A which is placed on the nearly horizontal mounting face 14a of the mounting base 14 are measured by measuring devices 32 to 37 at a class measuring device 6 which is installed at an upper-side conveyance passage. While the leek A is kept by arms 16, 17, it is revolved and moved to the side of a lower-side conveyance passage, and its surface and its rear are reversed. The prescribed items on the rear of the leaf part Ac are measured by measuring devices 38, 39 which are arranged and installed at the lower-side conveyance passage. On the basis of measured information by the devices 4, 5, 6, the prescribed items of the leek A are judged individually by a device body 7, and they are discharged by item to sorting parts e,... on the lower-side conveyance passage.
申请公布号 JP2002062126(A) 申请公布日期 2002.02.28
申请号 JP20000252082 申请日期 2000.08.23
申请人 ISHII IND CO LTD 发明人 MIYATA HISANORI;KONISHI YUKIMITSU;TAKEDA HIROAKI;KAKEMIZU GENTARO
分类号 G01B21/00;G01N21/27;G01N21/85;(IPC1-7):G01B21/00 主分类号 G01B21/00
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