发明名称 High-frequency semiconductor device
摘要 There is provided a high-frequency semiconductor device having an amplifier circuit, which amplifier minimizes deterioration of a high-frequency characteristic and attains high thermal stability. A driver stage of a power amplifier is formed so as to assume a multi-stage configuration by means of connecting multi-finger HBTs in shunt with each other, each multi-finger HBT comprising a single emitter. An output stage is formed so as to assume a single stage configuration by means of connecting multi-finger HBTs in shunt with each other, each HBT comprising two emitters. As a result, while an increase in capacity of p-n junction between an emitter layer and a base layer of the driver stage is prevented, thermal nonuniformity arising in the output stage is minimized. Thus, a power amplifier as a whole is configured with high thermal stability without deterioration of a high-frequency characteristic of the power amplifier.
申请公布号 US2002024391(A1) 申请公布日期 2002.02.28
申请号 US20010797867 申请日期 2001.03.05
申请人 MORIWAKI TAKAO 发明人 MORIWAKI TAKAO
分类号 H01L29/73;H01L21/331;H01L21/8222;H01L27/082;H01L29/205;H01L29/417;H01L29/423;H01L29/737;H03F1/30;H03F3/19;(IPC1-7):H03F3/14 主分类号 H01L29/73
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