发明名称 METHOD FOR DRYING A SEMICONDUCTOR WAFER, A MIXTURE FOR DRYING, AND A DRYER
摘要 A mixture of lower alcohols whose mean molecular weight is 46 or less is supplied onto a surface of a semiconductor wafer cleansed with water. With this supply, the amount of alcohols left on the semiconductor wafer which has been dried can be suppressed to 2ng/cm2 or less, and thus a gate oxide film formed on the semiconductor wafer is prevented from deterioration. As a result, a high yield of semiconductor products can be realized.
申请公布号 US2002023370(A1) 申请公布日期 2002.02.28
申请号 US20010929586 申请日期 2001.08.14
申请人 NEC CORPORATION 发明人 SASAKI YASUSHI
分类号 F26B5/00;F26B9/00;H01L21/00;H01L21/304;(IPC1-7):F26B3/00 主分类号 F26B5/00
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