发明名称 ANALYTICAL SYSTEM USING FEM OPTIMUM ANALYSIS METHOD AND RECORDING MEDIUM
摘要 <p>PROBLEM TO BE SOLVED: To solve the problem that action (the deformation of respective parts) and reaction (impact force) are wide apart from a real phenomenon when a positive analysis method is used for dynamic analysis, especially for the drop analysis of portable electronic equipment. SOLUTION: An optimum analysis method is selected and used for analysis by comparing an analytical time intervalΔtex by the explicit method with an analytical time intervalΔtim by the implicit method on the basis of the mesh size, Young's modulus and density of a model.</p>
申请公布号 JP2002063220(A) 申请公布日期 2002.02.28
申请号 JP20000252544 申请日期 2000.08.23
申请人 NEC CORP 发明人 HIRATA ICHIRO
分类号 G06F17/50;G06F19/00;(IPC1-7):G06F17/50 主分类号 G06F17/50
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