| 摘要 |
<p>The invention concerns an apparatus and a method for transmission measurement of the geometric structure of an optical component (2), comprising steps which consist in: illuminating the optical component with a first incident light (8, 10) whereof the wave front is known; measuring by deflectometry 16, 18) the wave front of said first light after transmission by said optical component; illuminating the optical component with a second incident light (12, 14) whereof the wave front is known; measuring by deflectometry (16, 18) the wave front of said second light after transmission by said optical component; and calculating the geometric structure of said optical component from the measured wave fronts during the measuring steps. The measurement of the light transmitted in two separate optical configurations enables to calculate by optimisation of the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second lights can be different and illuminate a common surface of the component, identical lights can also be used and each surface of the component can be illuminated successively.</p> |
