发明名称 PROBE FOR HOT EDDY CURRENT EXAMINATION
摘要 <p>PROBLEM TO BE SOLVED: To allow easy eddy current examination of high senstivity as to the presence of a defect generated on a surface of a testing body having a circular cross section, in a hot condition, and reduce the possibility of damage of a flaw detection coil in the eddy current examination to a small extent. SOLUTION: This eddy current examination probe 10 is provided with a coil case 12 of which an angleαof the tip part facing to the testing body 16 is 180 deg. or less, a ceramic shielding body 14 provided in the tip part of the coil case 12, and a coil part 20 stored in the coil case 12. The shielding body 14 is curved to form a sector shape along a surface of the testing body 16, and the flaw detection coil is arranged sector-shapedly in the coil part 20 along the surface of the testing body 16. A cooling water passage 12b is laid between the coil part 20 and the shielding body 14. A ceramic material containing silicon nitride as a main component is used preferably for the shielding body 14.</p>
申请公布号 JP2002062280(A) 申请公布日期 2002.02.28
申请号 JP20000250812 申请日期 2000.08.22
申请人 DAIDO STEEL CO LTD;HARA DENSHI SOKKI KK 发明人 KOJIMA KATSUHIRO;WATANABE HIROYUKI;ISOBE SHINICHI;YAMAZAKI MAKOTO
分类号 G01N27/90;B21C51/00;G21C17/003;(IPC1-7):G01N27/90 主分类号 G01N27/90
代理机构 代理人
主权项
地址